Thermal Analysis Evaluation System
Thermal Expansion Measurment System by Laser Interferometer
LIX-2 series
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High-accuracy measurement of thermal expansion with a minimum resolution of 1nm
This is a laser thermal expansion measurement system with ultra-high sensitivity developed by the use of the latest optical techniques. This system is suitable to be used as a calibration system for a standard thermal dilatometer, also to measure absolute thermal expansion measurements of unknown samples. This system is compliant with JIS R3251-1995, Measuring method of the linear thermal expansion coefficient for low expansion glass by laser interferometry.
This is a laser thermal expansion measurement system with ultra-high sensitivity developed by the use of the latest optical techniques. This system is suitable to be used as a calibration system for a standard thermal dilatometer, also to measure absolute thermal expansion measurements of unknown samples. This system is compliant with JIS R3251-1995, Measuring method of the linear thermal expansion coefficient for low expansion glass by laser interferometry.
Features
- Stable measurement is available with a parallel-shifting sample holder.
- High-accuracy measurement with reading resolution of 1nm
- With the use of a quartz sample, films or thin plates with thickness of 50 ～ 500μm can be measurable in the thickness direction.
Applications
- Measurement of organic films in the thickness direction
- Precise measurement of low expansion glass
- Quality control measurement of low expansion metal materials
- Measurement of seal materials
- Precise measurement of parts of electronic devices
- Measurement of calibration samples for a standard thermal dilatometer
Specifications
| Model | LIX-2M | LIX-2L |
|---|---|---|
| Temperature range | RT ～ 700℃ | －150 ～ 200℃ |
| Sample size | Φ5 ～ 6 × L10 ～ 15 (mm) Both sides in the length direction are finished spherically. | |
| Atmosphere | 1. Vacuum 2. Low pressure high purity helium gas | |
| Measurement method | Dual path Michelson laser interferometry | |
Patent and Standard
Complies with JISR 3251-1995 Parallel moving sample holder (patented)
