Multi Property Measurement System
Electric Resistance Measurement System for Metals and Semiconductors
TER series
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Metallic phase transition, aging, recrystallization reaction
This system can measure precisely the electric resistance of metallic alloys and semiconductors with DC four-thermal method.
This system can measure precisely the electric resistance of metallic alloys and semiconductors with DC four-thermal method.
Features
- Capable of electric resistance measurements in a constant-rate rising and falling temperature state and in a constant temperature state
- Capable of precise measurements with the DC four-terminal method
- Free from influence of thermal electromotive forces
Applications
- Research on metal phase transformation, age hardening, recrystallization
- Recrystallization analysis of amorphous metals
- Research and development of shape memory alloys
- Measurements of the electric resistance of various semiconductor materials at temperatures
Specifications
| Model | TER-2000RH | TER-2000L |
|---|---|---|
| Temperature range | RT ～ 1400℃ | -150℃～200℃ |
| Measurement method | DC four terminal method | |
| Measurement range | 100Ω～5×10-5Ω | |
| Sample Size | Φ 10 × L 100 (mm) | |
| tmosphere | Inert gas, Air, Vacuum (option) | |
